Toll Free: 888-883-2338
Local: 732-403-8355
info@techedu.com
My Account
Sign in to see your member price, rewards, orders, tracking and more.
Why Join? Gain access to exclusive pricing, rewards and more!
Member Pricing & Rewards active
Member Pricing & Rewards are active.
Versatile and reliable, this true RMS clamp meter is crafted for precision in a wide array of electrical testing tasksSHOP NOW
Shop our large selection of document cameras built for classroom use. Including ELMO, HoverCam, Lumens and more!SHOP NOW
Let us quote you our best price!
Allow us to earn your business and make this purchase easy.
Near Field Probe, Requency Range: 30MHz to 3GHz
Your Price: $499.00
Sign-in for EDU Pricing!
Thank you for your interest! Complete the form below and one of our support engineers will contact you directly to coordinate your product demonstration.
Name
Email Address
Phone Number
Which state are you located in?
Thank you!
We've received your request and will be in touch soon.
🤭 Oops there was an error processing your request. Please contact us by phone, chat or email to set-up your demo.
We accept purchase orders and all major credit cards. We also provide financing via Klarna at checkout for qualifying purchases.
Have a question or need to apply for payment terms?
Contact us.
The Rigol NFP-3 is used with RIGOL DSA series spectrum analyzer for the EMI tests of electronic products. It can be used to test the magnetic field strength and magnetic field coupling channels on the surface of the electronic components as well as the magnetic field environment near the electronic module so as to quickly locate the interference source. NFP-3 includes four models (NFP-3-P1, NFP-3-P2, NFP-3-P3 and NFP-3-P4). Connect the spectrum analyzer Connect the SMB (M) terminal of NFP-3 and the BNC (F) terminal of the N-BNC adaptor respectively via the BNC-SMB RF cable; connect the N (M) terminal of the N-BNC adaptor to the RF input terminal of the spectrum analyzer. Connect the device under test NFP-3 is used to perform short-distance noncontact measurement on the device under test. Pay attention to the direction of the probe during measuring. Typical Application Locate the EMI radiation interference source. Determine the frequency and relative strength of the spectral component of the interference source.
Please select a rating star.
Please complete this field.
Email Adrress is not Valid.
Almost there, please complete all required fields
Out of 5
Average Customer Review
Share your thoughts with other customers