Hioki 3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise


C Hi-Tester (1kHz and 1MHz) - Low Noise

  • High-speed analog test time of 0.6 ms (at 1 MHz)
  • Improved noise resistance and enhanced repeatability in measurement precision even for production lines
  • 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
  • BIN function, for easy component screening
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